Netherlands: Malvern Panalytical has launched a new version of Aeris, a compact X-ray diffractometer (XRD) product. The supplier said that the upgrade contains capabilities previously seen only in much larger systems. The device provides data from polycrystalline materials at ‘competitive’ speeds. Its operational interface simplifies XRD measurements. Grazing-incidence XRD (GIXRD) will enable the examination of thin films and coatings, while transmission measurements will provide more accurate data that are not affected by sample preparation artefacts.
Product manager Wilijan Vissers said, “I’m very proud that we’re launching our new Aeris – a model that continually raises the bar for powder XRD. By providing the data quality of a floor-standing system in a compact instrument, the new Aeris will enable a wider range of our customers to carry out in-depth materials analysis and optimise their processes – helping push the scientific frontier even further forward.”
